1. An introduction to logic circuit testing /
پدیدآورنده : Parag K. Lala
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Digital electronics-- Testing,Electric fault location,Integrated circuits-- Very large scale integration-- Testing,Logic circuits-- Testing
2. Analog test signal generation using periodic [sigma delta]-encoded data streams
پدیدآورنده : / by Benoit Dufort and Gordon W. Roberts
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Signal generators,Electronic circuits , Testing,Integrated circuits , Testing,Coding theory,Signal processing , Digital techniques,Analog-to-digital converters
رده :
E-BOOK
3. Automatic testing and evalustion of digital integrated circuits
پدیدآورنده : Healy, James Thomas
کتابخانه: Central Library and Information Center of Ferdowsi University of Mashhad (Khorasan Razavi)
موضوع : Testing ، Digital integrated circuits,، Automatic checkout equipment
رده :
TK
7874
.
H395
4. CTL for test information of digital ICs /
پدیدآورنده : by Rohit Kapur.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Computer hardware description languages.,Digital integrated circuits-- Testing-- Standards.,Computer hardware description languages.,TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- General.,TECHNOLOGY & ENGINEERING-- Electronics-- Circuits-- Integrated.
رده :
TK7874
.
65
.
K35
2003eb
5. Designing, testing, and diagnostics- join them
پدیدآورنده : International Test conference )3991: Baltimore, Md.(
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : ، Integrated circuits- Testing- congresses,، Electronic digital computers- Circuits- Testing-Congresses
رده :
TK
7874
.
I474
1993
6. Developments in integrated circuit testing
پدیدآورنده : / Editor D.M.Miller
کتابخانه: Central Library and Document Center of Arak University (Markazi)
موضوع : Digital integrated circuits-testing
رده :
621
.
38173
M647d
7. Digital circuit testing : a guide to DFT and other techniques
پدیدآورنده : Wang, Francis C.
موضوع : ، Digital integrated circuits-- Testing
۳ نسخه از این کتاب در ۳ کتابخانه موجود است.
8. Digital circuit testing: a guide to DFT and other techniques
پدیدآورنده : Wang, Francis C.
کتابخانه: Central Library and Documents Center of Industrial University of Khaje Nasiredin Toosi (Tehran)
موضوع : ، Digital integrated circuits- Testing
رده :
TK
7874
.
W363
9. Digital circuit testing and testability
پدیدآورنده : Lala, Parag K.
کتابخانه: Central Library and Documentation Center (Kerman)
موضوع : Testing ، Integrated circuits - Very large scale integration,Testing ، Digital integrated circuits,، Integrated circuits - Fault tolerance
رده :
TK
7874
.
75
.
L35
1997
10. Digital circuit testing and testability
پدیدآورنده : Lala, Parag K.
کتابخانه: Central Library of Sharif University of Technology (Tehran)
موضوع : ، Integrated circuits-- Very large scale integration-- Testing,، Digital integrated circuits-- Testing,، Integrated circuits-- Fault tolerance
رده :
TK
7874
.
75
.
L35
1997
11. Digital hardware testing. transistor-level fault modeling and testing
پدیدآورنده : Rajsuman, Rochit., Rochit Rajsuman
کتابخانه: Library and Documentation Center of Kurdistan University (Kurdistan)
موضوع : ، Electronic digital computers- Circuits- Testing- Data processing,، Integrated circuits- Very large scale integration- Testing- Data processing,، Electric fault location
رده :
TK
7888
.
4
.
R35
12. Digital integrated circuit testing from a quality perspective
پدیدآورنده : Hnatek, Eugene R.
کتابخانه: Central Library and Documentation Center (Kerman)
موضوع : Testing - Quality control ، Digital integrated circuits
رده :
TK
7874
.
H533
1993
13. Digital integrated circuits :design-for-test using Simulink and Stateflow
پدیدآورنده : Perelroyzen, Evgeni.
کتابخانه: Library of Niroo Research Institue (Tehran)
موضوع : Testing ، Digital integrated circuits,Design and construction ، Digital integrated circuits
14. Digital system test and testable design
پدیدآورنده : / Zainalabedin Navabi
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Digital integrated circuits, Testing,Digital integrated circuits, Design and construction,Verilog (Computer hardware description language)
رده :
E-BOOK
15. Digital system test and testable design
پدیدآورنده : / Zainalabedin Navabi
کتابخانه: Central Library, Center of Documentation and Supply of Scientific Resources (East Azarbaijan)
موضوع : Digital integrated circuits, Testing,Digital integrated circuits, Design and construction,Verilog (Computer hardware description language)
رده :
TK7874
.
N38
2011
16. Digital system test and testable design
پدیدآورنده : Zainalabedin Navabi
کتابخانه: Central Library and Information Center of Shahed University (Tehran)
موضوع : Digital integrated circuits, Testing,Digital integrated circuits, Design and construction,Verilog (Computer hardware description language)
رده :
TK
،
7874
،.
N38
،
2011
17. Digital systems testing and testable design
پدیدآورنده : Abramovici, Miron.
کتابخانه: Central Library of Amirkabir University of Technology (Tehran)
موضوع : Digital integrated circuits - Testing , Digital integrated circuits - Design and construction
رده :
TK
7874
.
A23
18. Digital systems testing and testable design
پدیدآورنده : Abramovici, Miron.
موضوع : ، Digital integrated circuits-- Testing,، Digital integrated circuits-- Design and construction
۶ نسخه از این کتاب در ۶ کتابخانه موجود است.
19. Digital systems testing and testable design /
پدیدآورنده : Miron Abramovici, Melvin A. Breuer, Arthur D. Friedman.
کتابخانه: Center and Library of Islamic Studies in European Languages (Qom)
موضوع : Digital integrated circuits-- Design and construction.,Digital integrated circuits-- Testing.,Digital integrated circuits-- Design and construction.,Digital integrated circuits-- Testing.
رده :
TK7874
.
A23
1990b
20. Essentials of digital signal processing using matlab
پدیدآورنده : vinay k.lngle, john g.proakis
کتابخانه: Central Library and Information Center of Shahed University (Tehran)
موضوع : Integrated circuits- Very large scale integration -- Testing,Digital integrated circuits -- Testing,Mixed signal circuits -- Testing,Semiconductor storage devices -- Testing
رده :
TK
،
7874
,.
75
،.
I5
,
E8
،
2012
